Andrea Baldini
Orcid: 0000-0003-2003-7604
According to our database1,
Andrea Baldini
authored at least 17 papers
between 2000 and 2024.
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Bibliography
2024
Novel VR-Based Biofeedback Systems: A Comparison Between Heart Rate Variability- and Electrodermal Activity-Driven Approaches.
IEEE Trans. Affect. Comput., 2024
2022
Subjective Fear in Virtual Reality: A Linear Mixed-Effects Analysis of Skin Conductance.
IEEE Trans. Affect. Comput., 2022
Modeling subjective fear using skin conductance: a preliminary study in virtual reality.
Proceedings of the 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society, 2022
2009
Proceedings of the 14th IEEE Symposium on Computers and Communications (ISCC 2009), 2009
Statistical profiling-based techniques for effective power provisioning in data centers.
Proceedings of the 2009 EuroSys Conference, Nuremberg, Germany, April 1-3, 2009, 2009
2008
Proceedings of the Ninth ACIS International Conference on Software Engineering, 2008
Proceedings of IEEE International Conference on Communications, 2008
Proceedings of IEEE International Conference on Communications, 2008
2007
Proceedings of the Global Communications Conference, 2007
2005
System-level functional testing from UML specifications in end-of-production industrial environments.
Int. J. Softw. Tools Technol. Transf., 2005
2004
Proceedings of the International Workshop on Test and Analysis of Component Based Systems, 2004
A Dependable Autonomic Computing Environment for Self-Testing of Complex Heterogeneous Systems.
Proceedings of the International Workshop on Test and Analysis of Component Based Systems, 2004
2003
Proceedings of the International Workshop on Test and Analysis of Component-Based Systems, 2003
2002
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002
Proceedings of the 2002 Design, 2002
2001
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001
2000
Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 2000