André Zimmermann
Orcid: 0000-0003-1824-9376
According to our database1,
André Zimmermann
authored at least 20 papers
between 2017 and 2024.
Collaborative distances:
Collaborative distances:
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Bibliography
2024
IEEE Trans. Engineering Management, 2024
Eng. Appl. Artif. Intell., 2024
2023
2022
Sensors, 2022
Towards Reliable Parameter Extraction in MEMS Final Module Testing Using Bayesian Inference.
Sensors, 2022
Graph neural networks for parameter estimation in micro-electro-mechanical system testing.
Array, 2022
2021
Sensors, 2021
Characterization of a PCB Based Pressure Sensor and Its Joining Methods for the Metal Membrane.
Sensors, 2021
Development and Proof of Concept of a Miniaturized MEMS Quantum Tunneling Accelerometer Based on PtC Tips by Focused Ion Beam 3D Nano-Patterning.
Sensors, 2021
2020
Quadrature Block for UHF Reflection Coefficient Measurements Using a Directional Coupler and Injection Locking.
IEEE Trans. Instrum. Meas., 2020
Identification of the Viscoelastic Properties of Soft Thermal Interface Layers Through Forward and Inverse Measurement Techniques.
IEEE Trans. Instrum. Meas., 2020
Inkjet-Printing of Nanoparticle Gold and Silver Ink on Cyclic Olefin Copolymer for DNA-Sensing Applications.
Sensors, 2020
Robust and fast part traceability in a production chain exploiting inherent, individual surface patterns.
Robotics Comput. Integr. Manuf., 2020
2019
IET Wirel. Sens. Syst., 2019
A Novel Approach for Reliability Investigation of LEDs on Molded Interconnect Devices Based on FE-Analysis Coupled to Injection Molding Simulation.
IEEE Access, 2019
2018
Effect of voids on thermo-mechanical reliability of chip resistor solder joints: Experiment, modelling and simulation.
Microelectron. Reliab., 2018
Effect of Joule heating on the reliability of solder joints under power cycling conditions.
Microelectron. Reliab., 2018
Reliability Study and Thermal Performance of LEDs on Molded Interconnect Devices (MID) and PCB.
IEEE Access, 2018
2017
Void Formation and Their Effect on Reliability of Lead-Free Solder Joints on MID and PCB Substrates.
IEEE Trans. Reliab., 2017
Sensors, 2017