André Touboul
According to our database1,
André Touboul
authored at least 16 papers
between 2001 and 2008.
Collaborative distances:
Collaborative distances:
Timeline
2001
2002
2003
2004
2005
2006
2007
2008
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Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2008
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications.
Microelectron. Reliab., 2008
2007
Microelectron. Reliab., 2007
2006
Microelectron. Reliab., 2006
Microelectron. Reliab., 2006
2005
Safe operating area of GaAs MESFET and PHEMT for amplification in overdrive operating conditions.
Microelectron. Reliab., 2005
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.
Microelectron. Reliab., 2005
2004
Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors.
Microelectron. Reliab., 2004
On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise.
Microelectron. Reliab., 2004
2003
Microelectron. Reliab., 2003
Low frequency drain noise comparison of AlGaN/GaN HEMT's grown on silicon, SiC and sapphire substrates.
Microelectron. Reliab., 2003
High current effects in InP/GaAsSb/InP DHBT: Physical mechanisms and parasitic effects.
Microelectron. Reliab., 2003
2002
Microelectron. Reliab., 2002
2001
Microelectron. Reliab., 2001
Microelectron. Reliab., 2001