Andleeb Zahra
According to our database1,
Andleeb Zahra
authored at least 13 papers
between 2018 and 2024.
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Bibliography
2024
A 275 pW, 0.5 V supply insensitive gate-leakage based current/voltage reference circuit for a wide temperature range of -55 to 100 °C without using amplifiers and resistors.
Microelectron. J., 2024
Proceedings of the IEEE International Symposium on Circuits and Systems, 2024
2023
Integr., November, 2023
Approximate Toom-Cook FFT with sparsity aware error tuning in a shared memory architecture.
Integr., March, 2023
Design and Fabrication of Microfluidic Chip for Temperature Control Applications in Biomedical.
Proceedings of the 16th International Conference on Sensing Technology, 2023
A Label-Free Low-Cost Radio Frequency Driven Noninvasive Lab-on-Chip System for Creatinine Detection.
Proceedings of the 16th International Conference on Sensing Technology, 2023
A High PSRR CMOS Voltage and Current Reference in One Circuit Without Amplifier for Low Power Applications.
Proceedings of the International Conference on Microelectronics, 2023
Proceedings of the International Conference on Computer and Applications, 2023
2021
PVT and Aging Degradation Invariant Automated Optimization Approach for CMOS Low-Power High-Performance VLSI Circuits.
Proceedings of the 22nd International Symposium on Quality Electronic Design, 2021
Algorithm Driven Power-Timing Optimization Methodology for CMOS Digital Circuits Considering PVTA Variations.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2021
2019
Statistical Variation Aware Leakage and Total Power Estimation of 16 nm VLSI Digital Circuits Based on Regression Models.
Proceedings of the VLSI Design and Test - 23rd International Symposium, 2019
A Highly Accurate Machine Learning Approach to Modelling PVT Variation Aware Leakage Power in FinFET Digital Circuits.
Proceedings of the 2019 IEEE Asia Pacific Conference on Circuits and Systems, 2019
2018
LEADER: Leakage Currents Estimation Technique for Aging Degradation Aware 16 nm CMOS Circuits.
Proceedings of the VLSI Design and Test - 22nd International Symposium, 2018