Amos Hong
According to our database1,
Amos Hong
authored at least 2 papers
between 2012 and 2021.
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Bibliography
2021
Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters.
Adv. Eng. Informatics, 2021
2012
Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis.
Proceedings of the Winter Simulation Conference, 2012