Amit Laknaur

According to our database1, Amit Laknaur authored at least 9 papers between 2005 and 2016.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2016
Test method and scheme for low-power validation in modern SOC integrated circuits.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2009
Design of a window comparator with adaptive error threshold for online testing applications.
Microelectron. J., 2009

2007
A Programmable Window Comparator for Analog Online Testing.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

A Fully Programmable Analog Window Comparator.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

2006
Built-In-Self-Testing Techniques for Programmable Capacitor Arrays.
J. Electron. Test., 2006

Investigating the Efficiency of Integrator-Based Capacitor Array Testing Techniques.
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Design ofWindow Comparators for Integrator-Based Capacitor Array Testing Circuits.
Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

2005
A methodology to perform online self-testing for field-programmable analog array circuits.
IEEE Trans. Instrum. Meas., 2005

Built-In-Self-Testing Techniques for Programmable Capacitor Arrays.
Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005


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