Ambika Prasad Shah

Abhay Pratap Singh

Microelectron. J., February, 2024

High-performance anti-series diode ring amplifier for switched capacitor circuits.

[BibT_eX]

[DOI]

Integr., 2024

Parallel-Series Diode-based Ring Amplifier for Switched Capacitor Circuits.

[BibT_eX]

[DOI]

Zainubia

Bipul Kumar Singh

Manish Pundir

Subhash Chander Dubey

Proceedings of the 37th International Conference on VLSI Design and 23rd International Conference on Embedded Systems, 2024

High-Performance Stacked Dynamic Comparator for Analog to Digital Converters.

[BibT_eX]

[DOI]

Vipul Sahu

Proceedings of the 28th International Symposium on VLSI Design and Test, 2024

2023

Leakage power attack resilient Schmitt trigger based 12T symmetric SRAM cell.

[BibT_eX]

[DOI]

Neha Gupta

Microelectron. J., September, 2023

Reversible Gates: A Paradigm Shift in Computing.

[BibT_eX]

[DOI]

IEEE Open J. Circuits Syst., 2023

Soft Error Immune with Enhanced Critical Charge SIC14T SRAM Cell for Avionics Applications.

[BibT_eX]

[DOI]

Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023

Noninverting Schmitt Trigger Circuit with Improved Hysteresis Behavior.

[BibT_eX]

[DOI]

Umesh Jangral

Proceedings of the 18th Conference on Ph.D Research in Microelectronics and Electronics, 2023

High-Performance Floating Resistor-based Ring Amplifier for Switched Capacitor Circuits.

[BibT_eX]

[DOI]

Proceedings of the IEEE Nordic Circuits and Systems Conference, 2023

Leakage Power Attack and Half Select Issue Resilient Split 8T SRAM Cell.

[BibT_eX]

[DOI]

Mansi Chawla

Proceedings of the 21st IEEE Interregional NEWCAS Conference, 2023

Domino Logic based Noise Immune Schmitt Trigger Circuit.

[BibT_eX]

[DOI]

Shubham Singh

Proceedings of the IEEE International Symposium on Smart Electronic Systems, 2023

Current Mirror-based High-Performance Ring Amplifier for Switched Capacitor Circuits.

[BibT_eX]

[DOI]

Bipul Kumar Singh

Manish Pundir

Proceedings of the 30th IEEE International Conference on Electronics, Circuits and Systems, 2023

Radiation Hardened and Leakage Power Attack Resilient 12T SRAM Cell for Secure Nuclear Environments.

[BibT_eX]

[DOI]

Debabrata Mondal

Proceedings of the Great Lakes Symposium on VLSI 2023, 2023

2022

Next generation QCA technology based true random number generator for cryptographic applications.

[BibT_eX]

[DOI]

Mohammad Mudakir Fazili

Mohsin Fayaz Shah

Microelectron. J., 2022

Aging Resilient and Energy Efficient Ring Oscillator for PUF Design.

[BibT_eX]

[DOI]

Anmol Verma

Shubhang Srivastava

Proceedings of the VLSI Design and Test - 26th International Symposium, 2022

QCA Technology Based 8-Bit TRNG Design for Cryptography Applications.

[BibT_eX]

[DOI]

Proceedings of the VLSI Design and Test - 26th International Symposium, 2022

Pass Transistor XOR Gate Based Radiation Hardened RO-PUF.

[BibT_eX]

[DOI]

Sajid Khan

Proceedings of the VLSI Design and Test - 26th International Symposium, 2022

Metastable SR Flip-Flop Based True Random Number Generator Using QCA Technology.

[BibT_eX]

[DOI]

Proceedings of the VLSI Design and Test - 26th International Symposium, 2022

2021

A Low-Leakage Variation-Aware 10T SRAM Cell for IoT Applications.

[BibT_eX]

[DOI]

Pushpa Raikwal

Vaibhav Neema

J. Circuits Syst. Comput., 2021

Voltage Bootstrapped Schmitt Trigger based Radiation Hardened Latch Design for Reliable Circuits.

[BibT_eX]

[DOI]

Neha Gupta

Nikhil Agrawal

Narendra Singh Dhakad

Patrick Girard

Proceedings of the GLSVLSI '21: Great Lakes Symposium on VLSI 2021, 2021

Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata.

[BibT_eX]

[DOI]

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications.

[BibT_eX]

[DOI]

Michael Hübner

J. Electron. Test., 2020

A 2.4-GS/s Power-Efficient, High-Resolution Reconfigurable Dynamic Comparator for ADC Architecture.

[BibT_eX]

[DOI]

Circuits Syst. Signal Process., 2020

Impact of Aging on Soft Error Susceptibility in CMOS Circuits.

[BibT_eX]

[DOI]

Patrick Girard

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

2019

An improved read-assist energy efficient single ended P-P-N based 10T SRAM cell for wireless sensor network.

[BibT_eX]

[DOI]

Microelectron. J., 2019

An ultra-low power, reconfigurable, aging resilient RO PUF for IoT applications.

[BibT_eX]

[DOI]

Sajid Khan

Neha Gupta

Shailesh Singh Chouhan

Jai Gopal Pandey

Microelectron. J., 2019

SUBHDIP: process variations tolerant subthreshold Darlington pair-based NBTI sensor circuit.

[BibT_eX]

[DOI]

Nandakishor Yadav

Ankur Beohar

IET Comput. Digit. Tech., 2019

Utilizing NBTI for Operation Detection of Integrated Circuits.

[BibT_eX]

[DOI]

Amirhossein Moshrefi

Michael Waltl

Proceedings of the VLSI Design and Test - 23rd International Symposium, 2019

Compact Spiking Neural Network System with SiGe Based Cylindrical Tunneling Transistor for Low Power Applications.

[BibT_eX]

[DOI]

Bhupendra Singh Reniwal

Proceedings of the VLSI Design and Test - 23rd International Symposium, 2019

Low Cost and High Performance Radiation Hardened Latch Design for Reliable Circuits.

[BibT_eX]

[DOI]

Michael Waltl

Proceedings of the 26th IEEE International Conference on Electronics, Circuits and Systems, 2019

2018

An efficient NBTI sensor and compensation circuit for stable and reliable SRAM cells.

[BibT_eX]

[DOI]

Nandakishor Yadav

Ankur Beohar

Microelectron. Reliab., 2018

2017

LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits.

[BibT_eX]

[DOI]

Nandakishor Yadav

Proceedings of the VLSI Design and Test - 21st International Symposium, 2017

2015

A novel leakage reduction DOIND approach for nanoscale domino logic circuits.

[BibT_eX]

[DOI]