Aman Kokrady

According to our database1, Aman Kokrady authored at least 5 papers between 2003 and 2008.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2008
Memory Yield Improvement through Multiple Test Sequences and Application-Aware Fault Models.
Proceedings of the 21st International Conference on VLSI Design (VLSI Design 2008), 2008

The Importance of Functional-Like Access for Memory Test.
Proceedings of the 2008 IEEE International Test Conference, 2008

2006
Reducing Design Verification Cycle Time through Testbench Redundancy.
Proceedings of the 19th International Conference on VLSI Design (VLSI Design 2006), 2006

2004
Fast, Layout-Aware Validation of Test-Vectors for Nanometer-Related Timing Failures.
Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

2003
Static Verification of Test Vectors for IR Drop Failure.
Proceedings of the 2003 International Conference on Computer-Aided Design, 2003


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