Aman Kokrady
According to our database1,
Aman Kokrady
authored at least 5 papers
between 2003 and 2008.
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Bibliography
2008
Memory Yield Improvement through Multiple Test Sequences and Application-Aware Fault Models.
Proceedings of the 21st International Conference on VLSI Design (VLSI Design 2008), 2008
Proceedings of the 2008 IEEE International Test Conference, 2008
2006
Proceedings of the 19th International Conference on VLSI Design (VLSI Design 2006), 2006
2004
Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004
2003
Proceedings of the 2003 International Conference on Computer-Aided Design, 2003