Alok Ranjan
Orcid: 0000-0003-4592-1674Affiliations:
- Singapore University of Technology and Design, Engineering Product Development
According to our database1,
Alok Ranjan
authored at least 7 papers
between 2015 and 2020.
Collaborative distances:
Collaborative distances:
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Online presence:
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on orcid.org
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Bibliography
2020
Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2016
Conductive filament formation at grain boundary locations in polycrystalline HfO<sub>2</sub> -based MIM stacks: Computational and physical insight.
Microelectron. Reliab., 2016
Analysis of quantum conductance, read disturb and switching statistics in HfO<sub>2</sub> RRAM using conductive AFM.
Microelectron. Reliab., 2016
2015
An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO<sub>2</sub>/SiO<sub>x</sub> dielectric stacks for failure analysis.
Microelectron. Reliab., 2015