Alodeep Sanyal
According to our database1,
Alodeep Sanyal
authored at least 22 papers
between 2005 and 2017.
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Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2017
Proceedings of the IEEE International Test Conference, 2017
2014
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
2013
Proceedings of the 31st IEEE VLSI Test Symposium, 2013
2012
Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays.
IEEE Trans. Very Large Scale Integr. Syst., 2012
A Pattern Generation Technique for Maximizing Switching Supply Currents Considering Gate Delays.
IEEE Trans. Computers, 2012
2010
An Efficient Technique for Leakage Current Estimation in Nanoscaled CMOS Circuits Incorporating Self-Loading Effects.
IEEE Trans. Computers, 2010
IEEE Des. Test Comput., 2010
RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverage.
Proceedings of the 2011 IEEE International Test Conference, 2010
2009
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009
Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009
A study on impact of aggressor de-rating in the context of multiple crosstalk effects in circuits.
Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, 2009
2008
A Built-in Test and Characterization Method for Circuit Marginality Related Failures.
Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008
Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008
Proceedings of the Design, Automation and Test in Europe, 2008
2007
An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect.
Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007
Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007
Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007
Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007
2006
Proceedings of the 24th International Conference on Computer Design (ICCD 2006), 2006
2005
Dynamic power minimization during combinational circuit testing as a traveling salesman problem.
Proceedings of the IEEE Congress on Evolutionary Computation, 2005