Allan Gutjahr
According to our database1,
Allan Gutjahr
authored at least 2 papers
between 1993 and 1995.
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Bibliography
1995
Realizing a high measure of confidence for defect level analysis of random testing [VLSI].
IEEE Trans. Very Large Scale Integr. Syst., 1995
1993
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993