Allan Gutjahr

According to our database1, Allan Gutjahr authored at least 2 papers between 1993 and 1995.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

1995
Realizing a high measure of confidence for defect level analysis of random testing [VLSI].
IEEE Trans. Very Large Scale Integr. Syst., 1995

1993
Realizing a High Measure of Confidence for Defect Level Analysis of Random Testing.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993


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