Ali Shafiekhani

According to our database, Ali Shafiekhani authored at least 9 papers between 2017 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Spatio-Temporal Reconstruction and Visualization of Plant Growth for Phenotyping.

Jacket Demby's, Ali Shafiekhani, Felix B. Fritschi, Guilherme N. DeSouza

Proceedings of the IEEE Symposium Series on Computational Intelligence, 2021

2019

Object Detection and Pose Estimation Using CNN in Embedded Hardware for Assistive Technology.

Jacket Demby's, Yixiang Gao, Ali Shafiekhani, Guilherme N. DeSouza

Proceedings of the IEEE Symposium Series on Computational Intelligence, 2019

VisND: A Visualization Tool for Multidimensional Model of Canopy.

Ali Shafiekhani, Felix B. Fritschi, Guilherme N. DeSouza

Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition Workshops, 2019

2018

A New 4D-RGB Mapping Technique for Field-Based High-Throughput Phenotyping.

Ali Shafiekhani, Felix B. Fritschi, Guilherme N. DeSouza

Proceedings of the British Machine Vision Conference 2018, 2018

2017

Vinobot and Vinoculer: Two Robotic Platforms for High-Throughput Field Phenotyping.

Ali Shafiekhani, Suhas Kadam, Felix B. Fritschi, Guilherme N. DeSouza

Sensors, 2017

Design and Analysis of a Controller Using Quantitative Feedback Theory for a Vehicle Air Suspension System.

Ali Shafiekhani, Seyed Mehdi Mirsadeghi, Keivan Torabi

CoRR, 2017

Design and implementation of an adaptive critic-based neuro-fuzzy controller on an unmanned bicycle.

Ali Shafiekhani, Mohammad J. Mahjoob, Mehdi Akraminia

CoRR, 2017

Automated Classification of Wrinkle Levels in Seed Coat Using Relevance Vector Machine.

Ali Shafiekhani, A. P. Dhanapal, Jason D. Gillman, Felix B. Fritschi, Guilherme N. DeSouza

Proceedings of the 2017 IEEE Applied Imagery Pattern Recognition Workshop, 2017

Multi-Scale Spatially Weighted Local Histograms in O(1).

Mahdieh Poostchi, Ali Shafiekhani, Kannappan Palaniappan, Guna Seetharaman

Proceedings of the 2017 IEEE Applied Imagery Pattern Recognition Workshop, 2017