Alfred L. Crouch

According to our database, Alfred L. Crouch authored at least 46 papers between 1989 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

IEEE P1687.1: Extending the Network Boundaries for Test.

Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo

Proceedings of the IEEE International Test Conference, 2022

2021

3D Ring Oscillator Based Test Structures to Detect a Trojan Die in a 3D Die Stack in the Presence of Process Variations.

Soha Alhelaly, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Ping Gui, Alfred L. Crouch

IEEE Trans. Emerg. Top. Comput., 2021

2020

A role for embedded instrumentation in real-time hardware assurance and online monitoring against cybersecurity threats.

Alfred L. Crouch, Adam W. Ley

IEEE Instrum. Meas. Mag., 2020

Modeling Novel Non-JTAG IEEE 1687-Like Architectures.

Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick

Proceedings of the IEEE International Test Conference, 2020

2019

Innovative Practices on IEEE 1687.xyz.

Jeff Rearick, Alfred L. Crouch, Hans Martin von Staudt

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Innovate Practices on CyberSecurity of Hardware Semiconductor Devices.

Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

2018

Innovative practices on machine learning for emerging applications.

Kareem Madkour, Zhaobo Zhang, Alfred L. Crouch, Peter L. Levin, Eve Hunter, Yu Huang

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

2017

Generalizing Access to Instrumentation Embedded in a Semiconductor Device.

Al Crouch, Michael Laisne, Martin Keim

Computer, 2017

Mitigating simple power analysis attacks on LSIB key logic.

Saurabh Gupta, Jennifer Dworak, Daniel Engels, Al Crouch

Proceedings of the 2017 IEEE North Atlantic Test Workshop, 2017

Detecting a trojan die in 3D stacked integrated circuits.

Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch

Proceedings of the 2017 IEEE North Atlantic Test Workshop, 2017

Increasing IJTAG bandwidth and managing security through parallel locking-SIBs.

Saurabh Gupta, Al Crouch, Jennifer Dworak, Daniel Engels

Proceedings of the IEEE International Test Conference, 2017

2016

Using Existing Reconfigurable Logic in 3D Die Stacks for Test.

Fanchen Zhang, Yi Sun, Xi Shen, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, Ping Gui, R. Iris Bahar, Al Crouch, John C. Potter

Proceedings of the 25th IEEE North Atlantic Test Workshop, 2016

Invited - A box of dots: using scan-based path delay test for timing verification.

Alfred L. Crouch, John C. Potter

Proceedings of the 53rd Annual Design Automation Conference, 2016

2015

A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard.

Jennifer Dworak, Al Crouch

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

2014

Board security enhancement using new locking SIB-based architectures.

Jennifer Dworak, Zoe Conroy, Alfred L. Crouch, John C. Potter

Proceedings of the 2014 International Test Conference, 2014

Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 network.

Adam Zygmontowicz, Jennifer Dworak, Al Crouch, John C. Potter

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System.

Alfred L. Crouch, John C. Potter, Ajay Khoche, Jennifer Dworak

IEEE Des. Test, 2013

Don't forget to lock your SIB: Hiding instruments using P16871.

Jennifer Dworak, Al Crouch, John C. Potter, Adam Zygmontowicz, Micah Thornton

Proceedings of the 2013 IEEE International Test Conference, 2013

BA-BIST: Board test from inside the IC out.

Zoe Conroy, Alfred L. Crouch

Proceedings of the 2013 IEEE International Test Conference, 2013

2012

Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox.

Zoe Conroy, James J. Grealish, Harrison Miles, Anthony J. Suto, Alfred L. Crouch, Skip Meyers

Proceedings of the 2012 IEEE International Test Conference, 2012

2009

We need more standards like IEEE 1500.

Miron Abramovici, Al Crouch

IEEE Des. Test Comput., 2009

IEEE P1687 IJTAG a presentation of current technology.

Ken Posse, Al Crouch, Jeff Rearick

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

The Advantages of Limiting P1687 to a Restricted Subset.

Jason Doege, Alfred L. Crouch

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

A Production IR-Drop Screen on a Chip.

Zahi S. Abuhamdeh, Bob Hannagan, Jeff Remmers, Alfred L. Crouch

IEEE Des. Test Comput., 2007

IJTAG: The path to organized instrument connectivity.

Alfred L. Crouch

Proceedings of the 2007 IEEE International Test Conference, 2007

Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip.

Zahi S. Abuhamdeh, Vincent D'Alassandro, Richard Pico, Dale Montrone, Alfred L. Crouch, Andrew Tracy

Proceedings of the 2007 IEEE International Test Conference, 2007

Processing High Volume Scan Test Results for Yield Learning.

Alfred L. Crouch, Phil Burlison, Dennis J. Ciplickas

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

2006

IEEE P1687: Toward Standardized Access of Embedded Instrumentation.

Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote

Proceedings of the 2006 IEEE International Test Conference, 2006

Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks.

Zahi S. Abuhamdeh, Philip Pears, Jeff Remmers, Alfred L. Crouch, Bob Hannagan

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

IJTAG (internal JTAG): a step toward a DFT standard.

Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Future Trends in Test: The Adoption and Use of Low Cost Structural Testers.

Alfred L. Crouch

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

AC Scan Path Selection for Physical Debugging.

Alfred L. Crouch, John C. Potter, Jason Doege

IEEE Des. Test Comput., 2003

2002

Testing the Tester: What Broke? Where? When? Why?

Alfred L. Crouch

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Very Low Cost Testers: Opportunities and Challenges.

Jay Bedsole, Rajesh Raina, Al Crouch, Magdy S. Abadir

IEEE Des. Test Comput., 2001

2000

Test Development for a Third-Version ColdFire Microprocessor.

Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran

IEEE Des. Test Comput., 2000

Optimization trade-offs for vector volume and test power.

Bahram Pouya, Alfred L. Crouch

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

The DFT Psychic Network.

Al Crouch

IEEE Des. Test Comput., 1999

The testability features of the 3rd generation ColdFire family of microprocessors.

Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Test Development for Second-Generation ColdFire Microprocessors.

Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja

IEEE Des. Test Comput., 1998

Best Methods for At-Speed Testing?

Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

1997

Designing and Verifying Embedded Microprocessors.

Al Crouch, Jeff Freeman

IEEE Des. Test Comput., 1997

A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors.

Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1995

The superscalar architecture of the MC68060.

Joe Circello, Greg Edgington, Dan McCarthy, James Gay, David Schimke, Steven Sullivan, Richard Duerden, Chris Hinds, Danny Marquette, Lal Sood, Al Crouch, Daniel Chow

IEEE Micro, 1995

1994

Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution.

Alfred L. Crouch, Rick Ramus, Colin M. Maunder

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

Testabilty Features of the MC 68060 Microprocessor.

Alfred L. Crouch, Matthew Pressly, Joe Circello

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1989

Prototype Testing Simplified by Scannable Buffers and Latches.

Andy Halliday, Greg Young, Alfred L. Crouch

Proceedings of the Proceedings International Test Conference 1989, 1989