Alexis Thieullen

According to our database, Alexis Thieullen authored at least 2 papers between 2012 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2013

Application of Principal Components Analysis to improve fault detection and diagnosis on semiconductor manufacturing equipment.

Alexis Thieullen, Mustapha Ouladsine, Jacques Pinaton

Proceedings of the 12th European Control Conference, 2013

2012

Dispatching of lots to dynamically reduce the wafers at risk in semiconductor manufacturing.

Gloria Rodríguez-Verján, Eric Tartiere, Jacques Pinaton, Stéphane Dauzère-Pérès, Alexis Thieullen

Proceedings of the 2012 IEEE International Conference on Automation Science and Engineering, 2012