Alexandra L. Zimpeck
Orcid: 0000-0002-3583-1002
According to our database1,
Alexandra L. Zimpeck
authored at least 42 papers
between 2014 and 2024.
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Online presence:
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Bibliography
2024
Guest Editorial Special Issue on the IEEE Latin American Symposium on Circuits and Systems (LASCAS 2023).
IEEE Trans. Circuits Syst. I Regul. Pap., March, 2024
2023
IEEE Trans. Circuits Syst. II Express Briefs, March, 2023
J. Internet Serv. Appl., January, 2023
Proceedings of the 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2023
Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2023
Proceedings of the 30th IEEE International Conference on Electronics, Circuits and Systems, 2023
2022
Exploring XOR-based Full Adders and decoupling cells to variability mitigation at FinFET technology.
Integr., 2022
2021
Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study.
Proceedings of the 22nd IEEE Latin American Test Symposium, 2021
Proceedings of the 12th IEEE Latin America Symposium on Circuits and System, 2021
Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit.
Proceedings of the 12th IEEE Latin America Symposium on Circuits and System, 2021
Sensitivity of FinFET Adders to PVT Variations and Sleep Transistor as a Mitigation Strategy.
Proceedings of the IEEE Asia Pacific Conference on Circuit and Systems, 2021
2020
IEEE Trans. Circuits Syst. I Regul. Pap., 2020
Proceedings of the IEEE Latin-American Test Symposium, 2020
Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters.
Proceedings of the IEEE Latin-American Test Symposium, 2020
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020
2019
Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs.
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
Proceedings of the VLSI-SoC: New Technology Enabler, 2019
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
Proceedings of the VLSI-SoC: New Technology Enabler, 2019
Proceedings of the 17th IEEE International New Circuits and Systems Conference, 2019
Proceedings of the 26th IEEE International Conference on Electronics, Circuits and Systems, 2019
2018
Microelectron. Reliab., 2018
Microelectron. Reliab., 2018
Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements.
Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018
Pros and Cons of Schmitt Trigger Inverters to Mitigate PVT Variability on Full Adders.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells.
Proceedings of the 25th IEEE International Conference on Electronics, Circuits and Systems, 2018
2017
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
Impact of schmitt trigger inverters on process variability robustness of 1-Bit full adders.
Proceedings of the 24th IEEE International Conference on Electronics, Circuits and Systems, 2017
Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices.
Proceedings of the 24th IEEE International Conference on Electronics, Circuits and Systems, 2017
2016
Microelectron. Reliab., 2016
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
Proceedings of the 2016 IEEE International Conference on Electronics, Circuits and Systems, 2016
Proceedings of the 2016 IEEE International Conference on Electronics, Circuits and Systems, 2016
2015
Microelectron. Reliab., 2015
Analyzing the Impact of Frequency and Diverse Path Delays in the Time Vulnerability Factor of Master-Slave D Flip-Flops.
Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015
Process variability in FinFET standard cells with different transistor sizing techniques.
Proceedings of the 2015 IEEE International Conference on Electronics, 2015
2014
Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations.
Microelectron. Reliab., 2014
Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices.
Proceedings of the 24th International Workshop on Power and Timing Modeling, 2014
Proceedings of the 21st IEEE International Conference on Electronics, Circuits and Systems, 2014