Alexandr M. Pilipenko

According to our database, Alexandr M. Pilipenko authored at least 9 papers between 2013 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2021

Application of Template Models for Current-Voltage Characteristics Approximation of Complementary MOSFETs.

Alexandr M. Pilipenko

Proceedings of the IEEE East-West Design & Test Symposium, 2021

2020

Measurement and Compact Modeling of Noise Characteristics in Complementary Junction Field-Effect Transistors.

Alexandr M. Pilipenko, Fedor A. Tsvetkov, Nikolay N. Prokopenko

Proceedings of the IEEE East-West Design & Test Symposium, 2020

2019

A Technique for Semiconductor Devices Modeling Using Physical Templates.

Alexandr M. Pilipenko, Vadim N. Biryukov, Alexander I. Serebryakov

Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019

A Template Model of Junction Field-Effect Transistors for a Wide Temperature Range.

Alexandr M. Pilipenko, Vadim N. Biryukov, Nikolay N. Prokopenko

Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019

2017

Development and testing of high accuracy hybrid methods for time-domain simulation of electronic circuits and systems.

Alexandr M. Pilipenko, Vadim N. Biryukov

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

2016

Methods of testing time-domain simulators in EDA packages.

Alexandr M. Pilipenko, Vadim N. Biryukov, Anastasia B. Fadeeva

Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

2015

Measurement-based MOSFET model for helium temperatures.

Vadim N. Biryukov, Alexandr M. Pilipenko

Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

2014

Modeling of MOSFETs parameters and volt-ampere characteristics in a wide temperature range for low noise amplifiers design.

Alexandr M. Pilipenko, Vadim N. Biryukov

Proceedings of the 2014 East-West Design & Test Symposium, 2014

2013

An approach to estimate the error of oscillator time-domain analysis.

Vadim N. Biryukov, Alexandr M. Pilipenko

Proceedings of the East-West Design & Test Symposium, 2013