Alexander Ivannikov

According to our database, Alexander Ivannikov authored at least 8 papers between 2016 and 2023.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2023

On Bipartite Circulant Graph Decompositions Based on Cartesian and Tensor Products with Novel Topologies and Deadlock-Free Routing.

Ahmed Ibrahim El-Mesady, Aleksandr Yu. Romanov, Aleksandr A. Amerikanov, Alexander Ivannikov

Algorithms, January, 2023

2021

Design of a Digital 3D Model of Transport-Technological Environment of Open-Pit Mines Based on the Common Use of Telemetric and Geospatial Information.

Igor O. Temkin, Alexander Myaskov, Sergey A. Deryabin, Iliya Konov, Alexander Ivannikov

Sensors, 2021

2020

Iterative Methods for Multi-Valued Logical Equation System Solving while Digital System Simulating.

Alexander Ivannikov

Proceedings of the IEEE East-West Design & Test Symposium, 2020

2018

SystemC Language Usage as the Alternative to the HDL and High-level Modeling for NoC Simulation.

Aleksandr Romanov, Alexander Ivannikov

Int. J. Embed. Real Time Commun. Syst., 2018

Formal Description of Possible Input Logical Signal Data Sequences for Digital Systems and Their Blocks.

Alexander Ivannikov, Nikolay Levchenko, Irina Romanova

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

2017

Application of exhaustive search, branch and bound, parallel computing and Monte-Carlo methods for the synthesis of quasi-optimal network-on-chip topologies.

Aleksandr Romanov, Irina Romanova, Alexander Ivannikov

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

2016

SystemC NoC simulation as the alternative to the HDL and high-level modeling.

Aleksandr Romanov, Aleksandr Ivannikov

Proceedings of the 18th Conference of Open Innovations Association and Seminar on Information Security and Protection of Information Technology, 2016

Algebraic models of digital system design debugging decomposition.

Alexander Ivannikov, Vladimir P. Kulagin, Aleksandr Romanov, Boris Pozdneev

Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016