Alexander Hanss

Orcid: 0000-0002-4881-624X

Affiliations:

Technische Hochschule Ingolstadt, Institute of Innovative Mobility, IIMo, Germany

According to our database¹, Alexander Hanss authored at least 4 papers between 2015 and 2021.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

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Bibliography

2021

A New Noise-Suppression Algorithm for Transient Thermal Analysis in Semiconductors Over Pulse Superposition.

[BibT_eX]

[DOI]

Maximilian Schmid

Sri Krishna Bhogaraju

Alexander Hanss

Gordon Elger

IEEE Trans. Instrum. Meas., 2021

2016

The influence of the phosphor layer as heat source and up-stream thermal masses on the thermal characterization by transient thermal analysis of modern wafer level high power LEDs.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2016

Transient thermal analysis for accelerated reliability testing of LEDs.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2016

2015

Analysis of solder joint reliability of high power LEDs by transient thermal testing and transient finite element simulations.

[BibT_eX]

[DOI]

Gordon Elger

Shri Vishnu Kandaswamy

Microelectron. J., 2015

Alexander Hanss

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