Alexander Albicki
According to our database1,
Alexander Albicki
authored at least 21 papers
between 1985 and 1996.
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Bibliography
1996
Extended hyperbolic congruential frequency hop code: generation and bounds for cross- and auto-ambiguity function.
IEEE Trans. Commun., 1996
Reducing power dissipation in CMOS circuits by signal probability based transistor reordering.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996
1995
Proceedings of the 1995 International Conference on Computer Design (ICCD '95), 1995
Proceedings of the 1995 International Conference on Computer Design (ICCD '95), 1995
1994
IEEE Trans. Very Large Scale Integr. Syst., 1994
Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994
Reducing Power Dissipation in Serially Connected MOSFET Circuits via Transistor Reordering.
Proceedings of the Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1994
1993
Double Edge Triggered Devices: Speed and Power Considerations.
Proceedings of the 1993 IEEE International Symposium on Circuits and Systems, 1993
Proceedings of the Proceedings 1993 International Conference on Computer Design: VLSI in Computers & Processors, 1993
Proceedings of the Third Great Lakes Symposium on Design Automation of High Performance VLSI Systems, 1993
1992
Design of Robust-Path-Delay-Fault-Testable Combinational Circuits by Boolean Space Expansion.
Proceedings of the Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1992
Proceedings of the Second Great Lakes Symposium on VLSI, 1992
Proceedings of the Second Great Lakes Symposium on VLSI, 1992
1991
Proceedings of the Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1991
1989
Proceedings of the Computer Design: VLSI in Computers and Processors, 1989
1988
Proceedings of the 13th Conference on Local Computer Networks, 1988
1985
Evaluation ot Monitor Complexity for Concurrently Testing Microprogrammed Control Units.
Proceedings of the Proceedings International Test Conference 1985, 1985
Automatic Design of Exhaustively Self-Testing Chips with Bilbo Modules.
Proceedings of the Proceedings International Test Conference 1985, 1985
Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applications.
Proceedings of the 22nd ACM/IEEE conference on Design automation, 1985