Alex S. Biewenga

According to our database, Alex S. Biewenga authored at least 6 papers between 1993 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

SiP-test: Predicting delivery quality.

Alex S. Biewenga, Frans G. M. de Jong

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

SiP-TAP: JTAG for SiP.

Frans G. M. de Jong, Alex S. Biewenga

Proceedings of the 2006 IEEE International Test Conference, 2006

2001

Testing and programming flash memories on assemblies during high volume production.

Frans G. M. de Jong, Alex S. Biewenga, D. C. L. (Erik) van Geest, T. F. Waayers

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1999

Static component interconnect test technology (SCITT) a new technology for assembly testing.

Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Testing a multichip package for a consumer communications application.

Alex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1993

Using Boundary Scan Test to Test Random Access Memory Clusters.

Math Muris, Alex S. Biewenga

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993