Alex Hsieh

According to our database, Alex Hsieh authored at least 1 paper in 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip.

Robert F. Molyneaux, Thomas A. Ziaja, Hong Kim, Shahryar Aryani, Sungbae Hwang, Alex Hsieh

Proceedings of the 2007 IEEE International Test Conference, 2007