Alex Guo

According to our database, Alex Guo authored at least 2 papers between 2015 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2016

Bias temperature instability (BTI) in GaN MOSFETs.

Alex Guo

PhD thesis, 2016

2015

Positive-bias temperature instability (PBTI) of GaN MOSFETs.

Alex Guo, Jesús A. del Alamo

Proceedings of the IEEE International Reliability Physics Symposium, 2015