Alex Guo

According to our database1, Alex Guo authored at least 2 papers between 2015 and 2016.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2016
Bias temperature instability (BTI) in GaN MOSFETs.
PhD thesis, 2016

2015
Positive-bias temperature instability (PBTI) of GaN MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2015


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