Alessandro Motta

According to our database, Alessandro Motta authored at least 12 papers between 2016 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Test-time augmentation with synthetic data addresses distribution shifts in spectral imaging.

Ahmad Bin Qasim, Alessandro Motta, Alexander Studier-Fischer, Jan Sellner, Leonardo Ayala, Marco Hübner, Marc Bressan, Berkin Özdemir, Karl-Friedrich Kowalewski, Felix Nickel, Silvia Seidlitz, Lena Maier-Hein

Int. J. Comput. Assist. Radiol. Surg., June, 2024

Handling Geometric Domain Shifts in Semantic Segmentation of Surgical RGB and Hyperspectral Images.

Silvia Seidlitz, Jan Sellner, Alexander Studier-Fischer, Alessandro Motta, Berkin Özdemir, Beat P. Müller-Stich, Felix Nickel, Lena Maier-Hein

CoRR, 2024

2023

Semantic Segmentation of Surgical Hyperspectral Images Under Geometric Domain Shifts.

Jan Sellner, Silvia Seidlitz, Alexander Studier-Fischer, Alessandro Motta, Berkin Özdemir, Beat Peter Müller-Stich, Felix Nickel, Lena Maier-Hein

Proceedings of the Medical Image Computing and Computer Assisted Intervention - MICCAI 2023, 2023

ePCM reliability improvement through active material carbon implantation.

Elisabetta Palumbo, Alessandro Motta, Elisa Petroni, Daniele Gallinari, Annalisa Gilardini, Amos Galbiati, Massimo Borghi, Roberto Annunziata, Andrea Redaelli

Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2022

Assessing User Privacy on Social Media: The Twitter Case Study.

Giovanni Livraga, Alessandro Motta, Marco Viviani

Proceedings of the OASIS@HT 2022: Open Challenges in Online Social Networks, 2022

Characterization of reset state through energy activation study in Ge-GST based ePCM.

Matteo Baldo, Lorenzo Turconi, Alessandro Motta, Elisa Petroni, Luca Laurin, Daniele Ielmini, Andrea Redaelli

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2018

Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas.

Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Egidio Ragonese, Giuseppe Palmisano

IEEE Trans. Circuits Syst. II Express Briefs, 2018

An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In.

Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini

J. Low Power Electron., 2018

A fully contactless wafer-level testing for UHF RFID tag with on-chip antenna.

Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano

Proceedings of the 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2018

Main Parasitic Effects in Contactless Wafer Testing.

Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano

Proceedings of the Applications in Electronics Pervading Industry, Environment and Society, 2018

2017

A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC.

Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

Thermal issues in test: An overview of the significant aspects and industrial practice.

Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser

Proceedings of the 34th IEEE VLSI Test Symposium, 2016