Alessandro Grossi

According to our database, Alessandro Grossi authored at least 12 papers between 2000 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

A graph-based algorithm for NVM address decoders testing.

Pierre Scaramuzza, Thomas Kern, Matteo Coppetta, Alessandro Grossi, Rudolf Ullmann

Proceedings of the IEEE International Test Conference, 2024

2023

28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers.

Alessandro Grossi, Matteo Coppetta, Stefano Aresu, Andreas Kux, Thomas Kern, Robert Strenz

Proceedings of the IEEE International Memory Workshop, 2023

2019

Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing.

Mamathamba Kalishettyhalli Mahadevaiah, Eduardo Pérez, Christian Wenger, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Finn Zahari, Hermann Kohlstedt, Martin Ziegler

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM.

Alessandro Grossi, Elisa Vianello, Cristian Zambelli, Pablo Royer, Jean-Philippe Noel, Bastien Giraud, Luca Perniola, Piero Olivo, Etienne Nowak

IEEE Trans. Very Large Scale Integr. Syst., 2018

An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays.

Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jérémy Alvarez-Herault, Ken Mackay

IEEE Trans. Emerg. Top. Comput., 2018

Role of synaptic variability in spike-based neuromorphic circuits with unsupervised learning.

Denys R. B. Ly, Alessandro Grossi, Thilo Werner, Thomas Dalgaty, Claire Fenouillet-Béranger, Elisa Vianello, Etienne Nowak

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

2017

Bioinspired Programming of Resistive Memory Devices for Implementing Spiking Neural Networks.

Elisa Vianello, Thilo Werner, Alessandro Grossi, Etienne Nowak, Barbara De Salvo, Luca Perniola, Olivier Bichler, Blaise Yvert

Proceedings of the on Great Lakes Symposium on VLSI 2017, 2017

2016

Reliability of 3D NAND Flash Memories.

Alessandro Grossi, Cristian Zambelli, Piero Olivo

Proceedings of the 3D Flash Memories, 2016

2015

Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions.

Alessandro Grossi, Cristian Zambelli, Piero Olivo, Jérémy Alvarez-Herault, Ken Mackay

Proceedings of the 15th Non-Volatile Memory Technology Symposium, 2015

RRAM Reliability/Performance Characterization through Array Architectures Investigations.

Cristian Zambelli, Alessandro Grossi, Piero Olivo, Christian Walczyk, Christian Wenger

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

Automated characterization of TAS-MRAM test arrays.

Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Jérémy Alvarez-Herault, Ken Mackay

Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015

2000

40-mm² 3-V-only 50-MHz 64-Mb 2-b/cell CHE NOR flash memory.

Giovanni Campardo, Rino Micheloni, Stefano Commodaro, Emilio Yero, Matteo Zammattio, Sabina Mognoni, Andrea Sacco, Massimiliano Picca, Alessandro Manstretta, Marco Scotti, Ilaria Motta, C. Golla, Andrea Pierin, Roberto Bez, Alessandro Grossi, Alberto Modelli, Angelo Visconti, Osama Khouri, Guido Torelli

IEEE J. Solid State Circuits, 2000