Alberto Rodriguez-Fernandez
Orcid: 0000-0003-4755-4169
According to our database1,
Alberto Rodriguez-Fernandez
authored at least 3 papers
between 2015 and 2018.
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Bibliography
2018
A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory.
Microelectron. Reliab., 2018
2017
Identification of the generation/rupture mechanism of filamentary conductive paths in ReRAM devices using oxide failure analysis.
Microelectron. Reliab., 2017
2015
Electrical characterization of multiple leakage current paths in HfO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub>-based nanolaminates.
Microelectron. Reliab., 2015