Alberto Pagani

According to our database, Alberto Pagani authored at least 8 papers between 2014 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

New R&R Methodology in Semiconductor Manufacturing Electrical Testing.

Lorella Bordogna, Fabio Brembilla, Alberto Pagani, Marco Spinetta

Proceedings of the IEEE International Test Conference, 2022

2018

Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas.

Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Egidio Ragonese, Giuseppe Palmisano

IEEE Trans. Circuits Syst. II Express Briefs, 2018

An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In.

Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini

J. Low Power Electron., 2018

A fully contactless wafer-level testing for UHF RFID tag with on-chip antenna.

Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano

Proceedings of the 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2018

Main Parasitic Effects in Contactless Wafer Testing.

Alessandro Finocchiaro, Giovanni Girlando, Alessandro Motta, Alberto Pagani, Giuseppe Palmisano

Proceedings of the Applications in Electronics Pervading Industry, Environment and Society, 2018

2017

A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC.

Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

Thermal issues in test: An overview of the significant aspects and industrial practice.

Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2014

Electro Optical Terahertz Pulse Reflectometry, a non destructive technique to localize defects on various type of package.

Antoine Reverdy, M. Marchetti, Allesandra Fudoli, Alberto Pagani, V. Goubier, M. Cason, Jesse Alton, Martin Igarashi, G. Gibbons

Microelectron. Reliab., 2014