Albert Mann
According to our database1,
Albert Mann
authored at least 3 papers
between 2007 and 2008.
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Bibliography
2008
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data.
Proceedings of the 2008 IEEE International Test Conference, 2008
2007
Faster defect localization in nanometer technology based on defective cell diagnosis.
Proceedings of the 2007 IEEE International Test Conference, 2007
Proceedings of the 2007 IEEE International Test Conference, 2007