Alan J. Weger
According to our database1,
Alan J. Weger
authored at least 23 papers
between 2003 and 2018.
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Bibliography
2018
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2015
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
2014
Proceedings of the 2014 International Test Conference, 2014
Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, 2014
2012
Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012
2011
Proceedings of the HOST 2011, 2011
Proceedings of the Design, Automation and Test in Europe, 2011
2010
Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, 2010
2008
Proceedings of the 45th Design Automation Conference, 2008
2007
Hotspot-Limited Microprocessors: Direct Temperature and Power Distribution Measurements.
IEEE J. Solid State Circuits, 2007
Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007
Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007
2006
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images.
Proceedings of the 2006 IEEE International Test Conference, 2006
Power Distribution Measurements of the Dual Core PowerPC<sup>TM</sup> 970MP Microprocessor.
Proceedings of the 2006 IEEE International Solid State Circuits Conference, 2006
2005
Microelectron. Reliab., 2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
2004
A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
2003
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.
Microelectron. Reliab., 2003
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003