Alain Bensoussan

Orcid: 0000-0003-0743-498X

Affiliations:

Thales Alenia Space, Toulouse, France

According to our database¹, Alain Bensoussan authored at least 6 papers between 2015 and 2023.

Collaborative distances:

Dijkstra number² of six.
Erdős number³ of four.

Timeline

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Article

PhD thesis

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Bibliography

2023

The Correct Hot Carrier Degradation Model.

[BibT_eX]

[DOI]

Joseph B. Bernstein

Emmanuel Bender

Alain Bensoussan

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2018

Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2018

Temperature and voltage effects on HTRB and HTGB stresses for AlGaN/GaN HEMTs.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Reliability prediction with MTOL.

[BibT_eX]

[DOI]

Joseph B. Bernstein

Alain Bensoussan

Emmanuel Bender

Microelectron. Reliab., 2017

2016

How to quantify and predict long term multiple stress operation: Application to Normally-Off Power GaN transistor technologies.

[BibT_eX]

[DOI]

Alain Bensoussan

Microelectron. Reliab., 2016

2015

A methodologic project to characterize and model COTS component reliability.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2015

Alain Bensoussan

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On csauthors.net:

Bibliography

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