Akio Ohta

According to our database1, Akio Ohta authored at least 12 papers between 2011 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2022
Magnetic-Field Dependent Electron Transport of Fe<sub>3</sub>Si Nanodots.
IEICE Trans. Electron., October, 2022

Study on Electron Emission from Phosphorus δ-Doped Si-QDs/Undoped Si-QDs Multiple-Stacked Structures.
IEICE Trans. Electron., October, 2022

2019
Characterization of Electron Field Emission from Multiple-Stacking Si-Based Quantum Dots.
IEICE Trans. Electron., 2019

2017
Embedding of Ti Nanodots into SiO<sub>x</sub> and Its Impact on Resistance Switching Behaviors.
IEICE Trans. Electron., 2017

2015
Resistance-Switching Characteristics of Si-rich Oxide Evaluated by Using Ni Nanodots as Electrodes in Conductive AFM Measurements.
IEICE Trans. Electron., 2015

2013
X-Ray Photoemission Study of SiO<sub>2</sub>/Si/Si<sub>0.55</sub>Ge<sub>0.45</sub>/Si Heterostructures.
IEICE Trans. Electron., 2013

Evaluation of Chemical Composition and Bonding Features of Pt/SiO<sub>x</sub>/Pt MIM Diodes and Its Impact on Resistance Switching Behavior.
IEICE Trans. Electron., 2013

Control of Interfacial Reaction of HfO<sub>2</sub>/Ge Structure by Insertion of Ta Oxide Layer.
IEICE Trans. Electron., 2013

Characterization of Resistive Switching of Pt/Si-Rich Oxide/TiN System.
IEICE Trans. Electron., 2013

2012
Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering.
IEICE Trans. Electron., 2012

2011
Impact of Annealing Ambience on Resistive Switching in Pt/TiO<sub>2</sub>/Pt Structure.
IEICE Trans. Electron., 2011

Characterization of Mg Diffusion into HfO<sub>2</sub>/SiO<sub>2</sub>/Si(100) Stacked Structures and Its Impact on Detect State Densities.
IEICE Trans. Electron., 2011


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