Akinori Maeda

According to our database, Akinori Maeda authored at least 6 papers between 1992 and 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2011

Multi Domain Test: Novel test strategy to reduce the Cost of Test.

Yasuhiro Takahashi, Akinori Maeda

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Actual implementation of multi domain test: Further reduction of cost of test.

Yasuhiro Takahashi, Akinori Maeda, Mitsuhiro Ogura

Proceedings of the 2011 IEEE International Test Conference, 2011

2008

A Method to Generate a Very Low Distortion, High Frequency Sine Waveform Using an AWG.

Akinori Maeda

Proceedings of the 2008 IEEE International Test Conference, 2008

Low Distortion Sine Waveform Generation by an AWG.

Akinori Maeda

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

How the noise floor affects the production yield.

Akinori Maeda

Proceedings of the 16th Asian Test Symposium, 2007

1992

The Advanced Test System Architecture Provides Fast and Accurate Test for a High Resolution ADC.

Akinori Maeda

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992