Ajith Sivadasan
According to our database1,
Ajith Sivadasan
authored at least 6 papers
between 2016 and 2018.
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Bibliography
2018
NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI.
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018
2017
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017
2016
Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016
Activity profiling: Review of different solutions to develop reliable and performant design.
Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016
Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis.
Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016