Ajit Sharma
Orcid: 0000-0001-6882-5947
According to our database1,
Ajit Sharma
authored at least 18 papers
between 2003 and 2025.
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Bibliography
2025
Int. J. Prod. Res., 2025
2024
Making electric vehicle batteries safer through better inspection using artificial intelligence and cobots.
Int. J. Prod. Res., February, 2024
2023
Digital twin design and analytics for scaling up electric vehicle battery production using robots.
Int. J. Prod. Res., December, 2023
2021
Inf. Syst. Manag., 2021
The interpretive model of manufacturing: a theoretical framework and research agenda for machine learning in manufacturing.
Int. J. Prod. Res., 2021
2020
Drive Through Robotics: Robotic Automation for Last Mile Distribution of Food and Essentials During Pandemics.
IEEE Access, 2020
2019
Enabling the Electric Future of Mobility: Robotic Automation for Electric Vehicle Battery Assembly.
IEEE Access, 2019
2017
A Sub-60-µA Multimodal Smart Biosensing SoC With >80-dB SNR, 35-µA Photoplethysmography Signal Chain.
IEEE J. Solid State Circuits, 2017
2016
Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
2009
A Sub-0.2°hr Bias Drift Micromechanical Silicon Gyroscope With Automatic CMOS Mode-Matching.
IEEE J. Solid State Circuits, 2009
2008
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008
2007
A 104-dB Dynamic Range Transimpedance-Based CMOS ASIC for Tuning Fork Microgyroscopes.
IEEE J. Solid State Circuits, 2007
Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007
2006
Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006
2005
Accurate Prediction of Substrate Parasitics in Heavily Doped CMOS Processes Using a Calibrated Boundary Element Solver.
IEEE Trans. Very Large Scale Integr. Syst., 2005
2004
A predictive methodology for accurate substrate parasitic extraction.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
2003
Strategies for simulation, measurement and suppression of digital noise in mixed-signal circuits.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2003