Aivars J. Lelis
According to our database1,
Aivars J. Lelis
authored at least 8 papers
between 2015 and 2023.
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Bibliography
2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2020
Towards a Robust Approach to Threshold Voltage Characterization and High Temperature Gate Bias Qualification.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Permanent and Transient Effects of High-Temperature Bias Stress on Room- Temperature $V_{T}$ Drift Measurements in SiC Power MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Reliability and Performance Issues in SiC MOSFETs: Insight Provided by Spin Dependent Recombination.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Bias temperature instabilities in 4H SiC metal oxide semiconductor field effect transistors: Insight provided by electrically detected magnetic resonance.
Microelectron. Reliab., 2018
Microelectron. Reliab., 2018
2015
Negative bias instability in 4H-SiC MOSFETS: Evidence for structural changes in the SiC.
Proceedings of the IEEE International Reliability Physics Symposium, 2015