Aihua Wu
Orcid: 0000-0003-3278-974XAffiliations:
- Hebei Semiconductor Research Institute, Metrology Centre, Shijiazhuang, China
- Jilin University, Changchun, China (PhD 2007)
Timeline
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on orcid.org
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Bibliography
2020
Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems.
IEEE Trans. Instrum. Meas., 2020
Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy.
IEEE Trans. Instrum. Meas., 2020