Adrián Faigón
Orcid: 0000-0002-9636-1550
According to our database1,
Adrián Faigón
authored at least 2 papers
between 2002 and 2021.
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Bibliography
2021
Proceedings of the 22nd IEEE Latin American Test Symposium, 2021
2002
Modeling of the I-V characteristics of high-field stressed MOS structures using a Fowler-Nordheim-type tunneling expression.
Microelectron. Reliab., 2002