Adrián Faigón

Orcid: 0000-0002-9636-1550

According to our database1, Adrián Faigón authored at least 2 papers between 2002 and 2021.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2021
Total Ionizing Dose Effects on Floating Gate Structures. Preliminary Results.
Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

2002
Modeling of the I-V characteristics of high-field stressed MOS structures using a Fowler-Nordheim-type tunneling expression.
Microelectron. Reliab., 2002


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