Adrian Evans

According to our database, Adrian Evans authored at least 33 papers between 1998 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Dedicated Hardware Accelerators for Processing of Sparse Matrices and Vectors: A Survey.

Valentin Isaac-Chassande, Adrian Evans, Yves Durand, Frédéric Rousseau

ACM Trans. Archit. Code Optim., June, 2024

City-Scale Multi-Camera Vehicle Tracking System with Improved Self-Supervised Camera Link Model.

Yuqiang Lin, Sam Lockyer, Adrian Evans, Markus Zarbock, Nic Zhang

CoRR, 2024

New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405.

Erik Jan Marinissen, Adrian Evans, Po-Yao Chuang, Martin Keim, Anshuman Chandra

Proceedings of the IEEE European Test Symposium, 2024

A Scalable Low-Latency FPGA Architecture for Spin Qubit Control Through Direct Digital Synthesis.

Mathieu Toubeix, Eric Guthmuller, Adrian Evans, Tristan Meunier

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

SpDCache: Region-Based Reduction Cache for Outer-Product Sparse Matrix Kernels.

Valentin Isaac-Chassande, Adrian Evans, Yves Durand, Frédéric Rousseau

Proceedings of the 35th IEEE International Conference on Application-specific Systems, 2024

2022

Improving DNN Fault Tolerance in Semantic Segmentation Applications.

Stéphane Burel, Adrian Evans, Lorena Anghel

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

MOZART: Masking Outputs with Zeros for Architectural Robustness and Testing of DNN Accelerators.

Stéphane Burel, Adrian Evans, Lorena Anghel

Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

Zero-Overhead Protection for CNN Weights.

Stéphane Burel, Adrian Evans, Lorena Anghel

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

2017

BPPT - Bulk potential protection technique for hardened sequentials.

Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

EDA support for functional safety - How static and dynamic failure analysis can improve productivity in the assessment of functional safety.

Dan Alexandrescu, Adrian Evans, Maximilien Glorieux, Issam Nofal

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

IZIP: In-place zero overhead interconnect protection via PIP redundancy.

Yi Luo, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen

Proceedings of the 12th IEEE International Conference on ASIC, 2017

2016

A Method to Design Single Error Correction Codes With Fast Decoding for a Subset of Critical Bits.

Pedro Reviriego, Mustafa Demirci, Adrian Evans, Juan Antonio Maestro

IEEE Trans. Circuits Syst. II Express Briefs, 2016

RIIF-2: Toward the next generation reliability information interchange format.

Alessandro Savino, Stefano Di Carlo, Alessandro Vallero, Gianfranco Politano, Dimitris Gizopoulos, Adrian Evans

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

2015

A Class of SEC-DED-DAEC Codes Derived From Orthogonal Latin Square Codes.

Pedro Reviriego, Salvatore Pontarelli, Adrian Evans, Juan Antonio Maestro

IEEE Trans. Very Large Scale Integr. Syst., 2015

Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor.

Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Enrico Costenaro, Dan Alexandrescu, Vikas Chandra, Razi Seyyedi

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

New insights into the impact of SEUs in FPGA CRAMs.

Sheng Wang, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen

IEICE Electron. Express, 2015

Analysis of advanced circuits for SET measurement.

Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Techniques for heavy ion microbeam analysis of FPGA SER sensitivty.

Adrian Evans, Dan Alexandrescu, Veronique Ferlet-Cavrois, Kay-Obbe Voss

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Flip-flop SEU reduction through minimization of the temporal vulnerability factor (TVF).

Adrian Evans, Enrico Costenaro, Arkady Bramnik

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

A call for cross-layer and cross-domain reliability analysis and management.

Dan Alexandrescu, Adrian Evans, Enrico Costenaro, Maximilien Glorieux

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

2014

New approaches for synthesis of redundant combinatorial logic for selective fault tolerance.

Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

Managing SER costs of complex systems through Linear Programming.

Dan Alexandrescu, Nematollah Bidokhti, Andy Yu, Adrian Evans, Enrico Costenaro

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

Connecting different worlds - Technology abstraction for reliability-aware design and Test.

Ulf Schlichtmann, Veit Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales.

Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Razi Seyyedi, Enrico Costenaro, Dan Alexandrescu

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Hot topic session 4A: Reliability analysis of complex digital systems.

Adrian Evans, Michael Nicolaidis, Rob Aitken, Burcin Aktan, Olivier Lauzeral

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance.

Hao Xie, Li Chen, Adrian Evans, Shi-Jie Wen, Rick Wong

Proceedings of the IEEE 19th Pacific Rim International Symposium on Dependable Computing, 2013

Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops.

Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Thiago Asis

Proceedings of the International Symposium on Quality Electronic Design, 2013

Hierarchical RTL-based combinatorial SER estimation.

Adrian Evans, Dan Alexandrescu, Enrico Costenaro, Liang Chen

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

State-aware single event analysis for sequential logic.

Dan Alexandrescu, Enrico Costenaro, Adrian Evans

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

Error detection in ternary CAMs using bloom filters.

Salvatore Pontarelli, Marco Ottavi, Adrian Evans, Shi-Jie Wen

Proceedings of the Design, Automation and Test in Europe, 2013

2012

RIIF - Reliability information interchange format.

Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

Single event upset tolerance in flip-flop based microprocessor cores.

Stefanos Valadimas, Yiorgos Tsiatouhas, Angela Arapoyanni, Adrian Evans

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

1998

Functional Verification of Large ASICs.

Adrian Evans, Allan Silburt, Gary Vrckovnik, Thane Brown, Mario Dufresne, Geoffrey Hall, Tung Ho, Ying Liu

Proceedings of the 35th Conference on Design Automation, 1998