Adam W. Ley

According to our database, Adam W. Ley authored at least 7 papers between 1999 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2020

A role for embedded instrumentation in real-time hardware assurance and online monitoring against cybersecurity threats.

Alfred L. Crouch, Adam W. Ley

IEEE Instrum. Meas. Mag., 2020

2009

Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?

Adam W. Ley

Proceedings of the 2009 IEEE International Test Conference, 2009

Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture.

Adam W. Ley

Proceedings of the 2009 IEEE International Test Conference, 2009

2007

JTAG system test in a MicroTCA world.

Bradford G. Van Treuren, Adam W. Ley

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test.

Bambang Suparjo, Adam W. Ley, Adam Cron, Heiko Ehrenberg

Proceedings of the 2006 IEEE International Test Conference, 2006

1999

Boundary Scan: The Internet of Test.

Mike Wondolowski, Ben Bennetts, Adam W. Ley

IEEE Des. Test Comput., 1999

The integration of boundary-scan test methods to a mixed-signal environment.

Adam W. Ley

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999