Abu S. M. Hassan

According to our database, Abu S. M. Hassan authored at least 6 papers between 1988 and 1999.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

1999

Logic BIST for large industrial designs: real issues and case studies.

Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1994

ScanBist: A Multifrequency Scan-Based BIST Method.

Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan

IEEE Des. Test Comput., 1994

1992

BIST of PCB interconnects using boundary-scan architecture.

Abu S. M. Hassan, Vinod K. Agarwal, Benoit Nadeau-Dostie, Janusz Rajski

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992

ScanBIST: A Multi-frequency Scan-based BIST Method.

Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1989

Testing of Glue Logic Interconnects Using Boundary Scan Architecture.

Abu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski, Benoit Nadeau-Dostie

Proceedings of the Proceedings International Test Conference 1989, 1989

1988

Testing and Diagnosis of Interconnects Using Boundary Scan Architecture.

Abu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski

Proceedings of the Proceedings International Test Conference 1988, 1988