Abhisek Dixit
Orcid: 0000-0002-2244-1697
According to our database1,
Abhisek Dixit
authored at least 7 papers
between 2003 and 2024.
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Bibliography
2024
Investigation on Positive Bias-Induced Threshold Voltage Instability in GaN-on-Si D-mode Power MIS-HEMTs.
Proceedings of the Device Research Conference, 2024
2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Large Signal RF Reliability of 45-nm RFSOI Power Amplifier Cell for Wi-Fi6 Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2009
Measurement and Analysis of Parasitic Capacitance in FinFETs with High-k Dielectrics and Metal-Gate Stack.
Proceedings of the VLSI Design 2009: Improving Productivity through Higher Abstraction, 2009
2003
A Novel Dynamic Threshold Operation Using Electrically Induced Junction MOSFET in the Deep Sub-micrometer CMOS Regime.
Proceedings of the 16th International Conference on VLSI Design (VLSI Design 2003), 2003