Abhilash Goyal

According to our database, Abhilash Goyal authored at least 9 papers between 2008 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2014

3D-ICs with self-healing capability for thermal effects in RF circuits.

Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

2012

A New Self-Healing Methodology for RF Amplifier Circuits Based on Oscillation Principles.

Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee, Duane C. Howard, John D. Cressler

IEEE Trans. Very Large Scale Integr. Syst., 2012

A self-testable SiGe LNA and Built-in-Self-Test methodology for multiple performance specifications of RF amplifiers.

Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee, Duane C. Howard, John D. Cressler

Proceedings of the Thirteenth International Symposium on Quality Electronic Design, 2012

2011

Methodologies for low-cost testing and self-healing of rf systems.

Abhilash Goyal

PhD thesis, 2011

2010

Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles.

Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee

J. Electron. Test., 2010

2009

Iterative built-in testing and tuning of mixed-signal/RF systems.

Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan

Proceedings of the 27th International Conference on Computer Design, 2009

A novel self-healing methodology for RF Amplifier circuits based on oscillation principles.

Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee

Proceedings of the Design, Automation and Test in Europe, 2009

Self-Calibrating Embedded RF Down-Conversion Mixers.

Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

Low-Cost One-Port Approach for Testing Integrated RF Substrates.

Abhilash Goyal, Madhavan Swaminathan

Proceedings of the 17th IEEE Asian Test Symposium, 2008