Abhijit Biswas
Orcid: 0000-0001-9436-0557
According to our database1,
Abhijit Biswas
authored at least 25 papers
between 2007 and 2024.
Collaborative distances:
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Bibliography
2024
SIAM J. Numer. Anal., February, 2024
CoRR, 2024
2023
J. Sci. Comput., October, 2023
Enhanced analog/RF performance of hybrid charge plasma based junctionless C-FinFET amplifiers at 10 nm technology node.
Microelectron. J., 2023
Accurate Solution of the Nonlinear Schrödinger Equation via Conservative Multiple-Relaxation ImEx Methods.
CoRR, 2023
Characterization of Tool Eccentricity of a CNC Milling Machine Using High Speed Imaging.
Proceedings of the 16th International Conference on Sensing Technology, 2023
2022
Interference Cancellation and Efficient Channel Allocation for Primary and Secondary Users Using Hybrid Cognitive (M2M) Mac Routing Protocol.
Int. J. Inf. Secur. Priv., 2022
Computación y Sistemas, 2022
Optimal MAC Scheduling Algorithm for Time-Sensitive Applications in Multi-UE Scenarios in 5G NR MmWave.
Proceedings of the Computational Intelligence in Communications and Business Analytics, 2022
2020
2019
Effects of asymmetric underlap spacers on nanoscale junctionless transistors and design of optimised CMOS amplifiers.
IET Circuits Devices Syst., 2019
Role of grooving angle of 14-nm-InAs channel quantum well MOSFETs in improving analogue/RF and linearity performance.
IET Circuits Devices Syst., 2019
2016
Affordable Wideband Sensor Coupled Vibrotactile Actuator Systems for Psychophysical Experiments.
Proceedings of the Haptics: Perception, Devices, Control, and Applications, 2016
2015
Vibrotactile Sensitivity Threshold: Nonlinear Stochastic Mechanotransduction Model of the Pacinian Corpuscle.
IEEE Trans. Haptics, 2015
IEEE Trans. Haptics, 2015
2014
Temperature dependent model for threshold voltage and subthreshold slope of strained-Si channel MOSFETs with a polysilicon gate.
Microelectron. Reliab., 2014
2013
Accurate modeling of the influence of back gate bias and interface roughness on the threshold voltage of nanoscale DG MOSFETs.
Microelectron. Reliab., 2013
2012
Investigations on electrical characteristics and reliability properties of MOS capacitors using HfAlO<sub>x</sub> on n-GaAs substrates.
Microelectron. Reliab., 2012
2011
Proc. IEEE, 2011
Performance analysis of long Ge channel double gate (DG) p MOSFETs with high-k gate dielectrics based on carrier concentration formulation.
Microelectron. Reliab., 2011
2010
Charge trapping and reliability characteristics of ultra-thin HfYO<sub>x</sub> films on n-GaAs substrates.
Microelectron. Reliab., 2010
2007
Proc. IEEE, 2007
Palomar Receive Terminal (PRT) for the Mars Laser Communication Demonstration (MLCD) Project.
Proc. IEEE, 2007