A. Vallett
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2022
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Bibliography
2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Performance Improvements of SiGe HBTs in 90nm BiCMOS Process with fT/fmax of 340/410 GHz.
Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022