A. V. Vairagar

According to our database, A. V. Vairagar authored at least 2 papers between 2004 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2006

A direct measurement of electromigration induced drift velocity in Cu dual damascene interconnects.

M. Y. Yan, King-Ning Tu, A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy

Microelectron. Reliab., 2006

2004

Electromigration behavior of dual-damascene Cu interconnects--Structure, width, and length dependences.

A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy

Microelectron. Reliab., 2004