A. Muehlhoff

According to our database, A. Muehlhoff authored at least 3 papers between 2001 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology.

Wafa Arfaoui, Germain Bossu, A. Muehlhoff, D. Lipp, R. Manuwald, T. Chen, Tanya Nigam, Mahesh Siddabathula

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2002

Inversion of degradation direction of n-channel MOS-FETs in off-state operation.

A. Muehlhoff

Microelectron. Reliab., 2002

2001

An Extrapolation Model for Lifetime Prediction for Off-State - Degradation of MOS-FETs.

A. Muehlhoff

Microelectron. Reliab., 2001