A. Divay

According to our database, A. Divay authored at least 6 papers between 2022 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Hybrid Integration of 3D-RF Interconnects on AlGaN/GaN/Si HEMT RF Transistor featuring 2.2W/mm Psat & 41% PAE @28GHz using a Robust and Cost-Effective Chiplet Heterogeneous Bonding Technique.

A. Divay, Olivier Valorge, Christophe Dubarry, M. Medbouhi, R. Franiatte, D. Mermin, R. Velard, Y. Gobil, F. Morisot, Erwan Morvan, Ismael Charlet, Luca Lucci, J. Lugo, Xavier Garros

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

A Methodology to Address RF Aging of 40nm CMOS PA Cells Under 5G mmW Modulation Profiles.

A. Divay, Cédric Dehos, Ismael Charlet, Fred Gaillard, B. Duriez, Xavier Garros, J. Antonijevic, Joycelyn Hai, Nathalie Revil, Jeremie Forest, Vincent Knopik, Florian Cacho, David Roy, X. Federspiel, S. Crémer, Pascal Chevalier

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Integrated Test Circuit for Off-State Dynamic Drain Stress Evaluation.

Joycelyn Hai, Florian Cacho, X. Federspiel, Tidjani Garba-Seybou, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications.

Joycelyn Hai, Florian Cacho, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould, Jeremie Forest, Vincent Knopik, Xavier Garros

Proceedings of the IEEE International Reliability Physics Symposium, 2022

CMOS FD-SOI Technologies Ruggedness for Millimeter Wave Power Amplifier Design.

B. Martineau, A. Bossuet, A. Divay, B. Blampey, Y. Morandini

Proceedings of the 29th IEEE International Conference on Electronics, Circuits and Systems, 2022

Highly robust and reliable power amplifiers in 22FDX and 45RFSOI technologies.

A. Bossuet, A. Divay, Baudouin Martineau, Cedric Dehos, B. Blampey, Y. Morandini

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022