A. Cruz Serra

According to our database, A. Cruz Serra authored at least 33 papers between 1998 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2012

An Alternating Direction Algorithm for Total Variation Reconstruction of Distributed Parameters.

Nuno B. Bras, José M. Bioucas-Dias, Raul Carneiro Martins, A. Cruz Serra

IEEE Trans. Image Process., 2012

2010

Cross-Correlation and Sine-Fitting Techniques for High-Resolution Ultrasonic Ranging.

Ricardo Queirós, Francisco André Corrêa Alegria, Pedro Silva Girão, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2010

Gaussian Jitter-Induced Bias of Sine Wave Amplitude Estimation Using Three-Parameter Sine Fitting.

F. Corrêa Alegria, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2010

2009

IEEE 1057 Jitter Test of Waveform Recorders.

Shahram Shariat-Panahi, Francisco André Corrêa Alegria, Antoni Mánuel Lázaro, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2009

Recent Developments on Impedance Measurements With DSP-Based Ellipse-Fitting Algorithms.

Pedro M. Ramos, Fernando M. Janeiro, Mouhaydine Tlemçani, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2009

New Spectrum Leakage Correction Algorithm for Frequency Estimation of Power System Signals.

Tomás Radil, Pedro M. Ramos, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2009

The Histogram Test of ADCs With Sinusoidal Stimulus Is Unbiased by Phase Noise.

F. Corrêa Alegria, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2009

Precision of Independently Based Gain and Offset Error of an ADC Using the Histogram Method.

F. Corrêa Alegria, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2009

2008

Impedance Measurement With Sine-Fitting Algorithms Implemented in a DSP Portable Device.

Tomás Radil, Pedro M. Ramos, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2008

PQ Monitoring System for Real-Time Detection and Classification of Disturbances in a Single-Phase Power System.

Tomás Radil, Pedro M. Ramos, Fernando M. Janeiro, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2008

Impedance measurement using multiharmonic least-squares waveform fitting algorithm.

Pedro M. Ramos, A. Cruz Serra

Comput. Stand. Interfaces, 2008

2007

Least Squares Multiharmonic Fitting: Convergence Improvements.

Pedro M. Ramos, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2007

Standard Histogram Test Precision of ADC Gain and Offset Error Estimation.

F. Corrêa Alegria, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2007

2006

Simulation and experimental results of multiharmonic least-squares fitting algorithms applied to periodic signals.

Pedro M. Ramos, Manuel Fonseca da Silva, Raul Carneiro Martins, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2006

ADC transfer curve types - A review.

F. Corrêa Alegria, A. Cruz Serra

Comput. Stand. Interfaces, 2006

2005

Combined spectral and histogram analysis for fast ADC testing.

António Manuel da Cruz Serra, Manuel Fonseca da Silva, Pedro M. Ramos, Raul Carneiro Martins, Linus Michaeli, Ján Saliga

IEEE Trans. Instrum. Meas., 2005

Overdrive in the ramp histogram test of ADCs.

Francisco André Corrêa Alegria, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2005

Uncertainty of ADC random noise estimates obtained with the IEEE 1057 standard test.

Francisco André Corrêa Alegria, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2005

Effective ADC linearity testing using sinewaves.

Francisco André Corrêa Alegria, Antonio Moschitta, Paolo Carbone, António Manuel da Cruz Serra, Dario Petri

IEEE Trans. Circuits Syst. I Regul. Pap., 2005

2004

An FFT-based method to evaluate and compensate gain and offset errors of interleaved ADC systems.

José Miguel Dias Pereira, P. M. B. Silva Girao, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2004

Performance of data acquisition systems from the user's point of view.

Francisco André Corrêa Alegria, Pedro Silva Girão, Vladimír Haasz, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2004

Analog-to-digital converter testing - new proposals.

A. Cruz Serra, F. Corrêa Alegria, Raul Carneiro Martins, Manuel Fonseca da Silva

Comput. Stand. Interfaces, 2004

2003

Representation and measurement of nonlinearities in stimulus signals.

Raul Carneiro Martins, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2003

Variance of the cumulative histogram of ADCs due to frequency errors.

Francisco André Corrêa Alegria, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2003

New methods to improve convergence of sine fitting algorithms.

Manuel Fonseca da Silva, A. Cruz Serra

Comput. Stand. Interfaces, 2003

Introduction to the special issue on ADC testing, 6th EuroWorkshop on ADC Modelling and Testing.

A. Cruz Serra

Comput. Stand. Interfaces, 2003

2002

Performance analysis of an ADC histogram test using small triangular waves.

Francisco André Corrêa Alegria, Pasquale Arpaia, António Manuel da Cruz Serra, Pasquale Daponte

IEEE Trans. Instrum. Meas., 2002

2001

A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing.

Pasquale Arpaia, António Manuel da Cruz Serra, Conceigio Libano Monteiro

IEEE Trans. Instrum. Meas., 2001

Influence of frequency errors in the variance of the cumulative histogram [in ADC testing].

Francisco André Corrêa Alegria, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2001

ADC interbit modulation: description, detection and quantification.

Raul Carneiro Martins, António Manuel da Cruz Serra

Comput. Stand. Interfaces, 2001

2000

Automatic calibration of analog and digital measuring instruments using computer vision.

Francisco André Corrêa Alegria, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2000

1999

Automated ADC characterization using the histogram test stimulated by Gaussian noise.

Raul Carneiro Martins, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 1999

1998

The use of a noise stimulus in ADC characterization.

Raul Carneiro Martins, António Manuel da Cruz Serra

Proceedings of the 5th IEEE International Conference on Electronics, Circuits and Systems, 1998