A. Alaeddine

According to our database, A. Alaeddine authored at least 3 papers between 2009 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2013

Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS).

Jian-Zhi Zhu, François Fouquet, Blaise Ravelo, A. Alaeddine, Moncef Kadi

Microelectron. Reliab., 2013

2010

Characteristics degradation of the SiGe HBT under electromagnetic field stress.

A. Alaeddine, M. Kadi, K. Daoud, B. Beydoun

Microelectron. Reliab., 2010

2009

Effects of electromagnetic near-field stress on SiGe HBT's reliability.

A. Alaeddine, M. Kadi, K. Daoud, B. Mazari

Microelectron. Reliab., 2009