Bo Yao
Affiliations:- Intel Corp., Hillsboro, OR, USA
- Purdue University, School of Electrical and Computer Engineering, USA (PhD 2013)
According to our database1,
Bo Yao
authored at least 5 papers
between 2010 and 2017.
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Bibliography
2017
Proceedings of the 2017 IEEE Computer Society Annual Symposium on VLSI, 2017
2014
Built-in generation of functional broadside tests considering primary input constraints.
Proceedings of the Great Lakes Symposium on VLSI 2014, GLSVLSI '14, Houston, TX, USA - May 21, 2014
2013
Transition faults and transition path delay faults: Test generation, path selection, and built-in generation of functional broadside tests
PhD thesis, 2013
Path selection based on static timing analysis considering input necessary assignments.
Proceedings of the 31st IEEE VLSI Test Symposium, 2013
2010
Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, 2010